Optik & Photonik

Aktuelle Ausgabe - Volume 13 Issue 3 (June 2018)

Cover Picture

Editorial

Contents

News

Company Profiles

Products

Research & Technology

Technology Report

Photonics Technologies for Medical Applications

EPIC General Assembly took place on 19th – 20th April in Berlin, attracting 220 presidents / CEOs / decision makers, mainly from EPIC member companies. It was an outstanding event as the association was celebrating its 15th anniversary.

  • Ana Belén González, Jose Pozo
  • Seite 20-21

Light Sources

Made Easy: CW Laser Light Widely Tunable Across the Visible

A remarkable number of photonic applications call for continuous‐wave (cw) laser light that is widely tunable throughout the visible range of the spectrum. However, this spectral region remains difficult to access with conventional tunable laser devices. This is why recently commercialized sources based on cw optical parametric oscillator (OPO) technology gain market awareness – and become increasingly recognized as...

  • Jaroslaw Sperling, Korbinian Hens
  • Seite 22-24

New Illumination Technology for Mask Aligner Lithography

Nowadays, integrated semiconductor circuits are used as components in nearly every electrical device. This would be difficult to imagine without the application of photolithography, one of the essential manufacturing methods in semiconductor and microsystem technology. In a German research project run by the Friedrich Schiller University Jena in collaboration with the Fraunhofer IOF, the conventionally used mercury vapor...

  • Martin Paster, Tina Weichelt
  • Seite 25-27

Make It Visible

Fluorescence applications are used in many different areas within manufacturing, as possible uses of fluorescent materials in quality control and testing are extremely diverse. The use of UV lighting is necessary when features on test objects that are invisible in daylight need to be made visible.

  • Linda Denner, Anne Kehl
  • Seite 28-29

Microscopy

Re‐Scan Confocal Microscopy

As we all know, the most important property of the confocal microscope is optical sectioning (axial resolution). A bit forgotten fact is that confocal microscopy has the potential of lateral super‐resolution (better resolution than Abbe's law dictates). This lateral super‐resolution can only be obtained by sacrificing precious fluorescence signal and thus by getting noisy images. This problem has now been solved by a simple...

  • Erik Manders
  • Seite 30-32

Machine Vision

Let There Be Structured Light

Automated optical inspection (AOI) is a powerful technique used in many manufacturing settings to provide real‐time, decisive measurements related to part quality. AOI is a great tool for the analysis of product defects, from simple mechanical errors to more complex failure mechanisms. Identifying defective parts early in the line, and either reworking them or rejecting them, can save companies money and help build a...

  • Georgina Park, Carey Ritchey, Joe Siddall
  • Seite 33-35

Image Simulation and Analysis

No image is perfect, except for paintings. We have to deal with various noise sources and image sensor artifacts as well as with diffraction and other geometrical effects. The simulation of such artifacts is a great help during a design process and a perfect method for proof of concepts: Without access to any real hardware it is possible to predict and visualize the performance of opto‐electronic systems. ...

  • Karsten Sengebusch
  • Seite 36-39

Machine Vision Ensures Excellence in Paper Processing

Since decades, the Swiss company Hunkeler has set standards for the paper processing industry. With Mitsubishi Electric's line scan bars and Stemmer Imaging as their machine vision partner, Hunkeler has now given a preview of future web inspection systems, integrated into their DP8 dynamic perforator.

  • Peter Stiefenhöfer
  • Seite 40-42

Materials Processing

Laser Repair of Defects in GaN LEDs

  • Ralph Delmdahl, Thorsten Passow, Michael Kunzer, Michael Binder
  • Seite 43-45

Measurement Technology

Measuring Thin Transparent Films Precisely

The determination of the thickness of thin transparent films with reflectometry is a well‐established cost‐effective robust method that can be used even in inline measurements. The method is based on measurements of the reflectance of the film and a numerical evaluation of the reflectance either by fast Fourier transform or nonlinear regression. In both cases the significance of the result depends upon several parameters in...

  • Michael Quinten
  • Seite 46-48

No Mobile Automatic Systems without Lidar

Photodiodes are key components for the automation of mobile systems. Applications encompass everything from drones through cleaning robots and logistics robots, to special vehicles for industry, construction, forestry, and agriculture. Avalanche photodiodes (APDs) are key components of these systems and enable the success of lidar – radar using light. Only lidar systems create the necessary conditions for comprehensive...

  • Karsten Bronowski
  • Seite 49-51

Calendar

Meetings

Service

Buyers' Guide

  • Seite 56-56

Index & Masthead

Company Index

  • Seite 57-57

Bestellen

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